The S200-MF is a new-generation spectrometer offering high spectral and spatial resolution across the full area of commercially available 2D array image sensors.
Thanks to its innovative optical bench and specially designed aberration-corrected optics, the S200-MF achieves complete astigmatism compensation both at the center and edges of the detector. This enables simultaneous acquisition of spectra from multiple fibers connected to the entrance slit, with the maximum number depending on the sensor height and fiber diameter. For standard 6 mm-tall sensors, several dozen fibers can be analyzed at once.
The S200-MF features a fixed entrance slit and operates either with or without optical fibers. When radiation is directly input into the spectrometer, the image from the analyzed area is projected onto the entrance slit, allowing the detector to capture spectral data with high spatial resolution.
Its compact design and short-focal-length optical bench provide excellent flat field and high image quality across the detector, enabling wide-range spectral imaging limited only by the sensor's spectral sensitivity.
